Chau, K. and Doan, N. 2017. DENSE SIFT FEATURE AND LOCAL NAIVE BAYES NEAREST NEIGHBOR FOR FACE RECOGNITION. TRA VINH UNIVERSITY JOURNAL OF SCIENCE. 7, 4 (Dec. 2017), 56-63. DOI:https://doi.org/10.35382/18594816.1.28.2017.46.